Procedure and apparatus for the determination of the noise level of an electronic object to be measured
US6965242B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 27, 2003 |
| Grant date | Nov 15, 2005 |
| Priority date | — |
| Expiry date | Jul 11, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R29/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for the determination of the magnitude of a noise (TDUT) of an electronic object to be measured (2) includes a sine signal source (1), which generates a sine signal (Sin) for input into said object to be measured (2) and a level meter (3) for the measurement of a power level at the output of the said object to be measured (2). In accord with the invention, the level meter (3) possesses a sine power detector device (31) for the capture of a sine power level ({circumflex over (P)}sin) and has a noise power level detector device (32) for a separate capture of a noise power level ({circumflex over (P)}noise).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.