Patent · US Expired

Procedure and apparatus for the determination of the noise level of an electronic object to be measured

US6965242B2 · kind B2 · utility

2Cited by
3References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 27, 2003
Grant dateNov 15, 2005
Priority date
Expiry dateJul 11, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R29/26
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus for the determination of the magnitude of a noise (TDUT) of an electronic object to be measured (2) includes a sine signal source (1), which generates a sine signal (Sin) for input into said object to be measured (2) and a level meter (3) for the measurement of a power level at the output of the said object to be measured (2). In accord with the invention, the level meter (3) possesses a sine power detector device (31) for the capture of a sine power level ({circumflex over (P)}sin) and has a noise power level detector device (32) for a separate capture of a noise power level ({circumflex over (P)}noise).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.