System and method for security inspection using microwave imaging
US6965340B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 24, 2004 |
| Grant date | Nov 15, 2005 |
| Priority date | — |
| Expiry date | Dec 24, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01Q21/065
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A security inspection system uses microwave radiation to image targets on a human subject or other item. The system includes an array of antenna elements that are programmable with a respective phase delay to direct a beam of microwave illumination toward a target on the human subject or item. The antenna elements are further capable of receiving reflected microwave illumination reflected from the target. A processor is operable to measure an intensity of the reflected microwave illumination to determine a value of a pixel within an image of the human subject or item. Multiple beams can be directed towards the human subject or item to obtain corresponding pixel values for use by the processor in constructing the image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.