System of measurements experts and method for generating high-performance measurements software drivers
US6965800B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 13, 2001 |
| Grant date | Nov 15, 2005 |
| Priority date | — |
| Expiry date | Jul 26, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/2656
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A measurements expert system and method for generating a high-performance measurements software driver. The measurements expert system translates a user's measurement task specification (MTS) specifying a measurement task into a solution, e.g., a run-time specification (RTS), suitable for the user's measurement system. The expert system includes programs for analyzing and validating the received MTS, and for generating the RTS. The RTS is useable to configure measurement devices to perform the measurement task, and to generate a run-time which is executable to perform the specified measurement task. The expert system includes a plurality of experts, e.g., device, channel, timing, reader/writer, control, and streaming experts, etc., each class of which manages different aspects of the MTS. The expert system creates a device expert call tree of associated experts according to the configuration specified by the user, manages the configuration of the MTS, verifies the MTS, and compiles the MTS into the RTS.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.