User available body scan chain

US6968487B1 · kind B1 · utility

Assignee

• Actel Corporation · US

Inventors

• Ian Bryant · Ridgefield, US
• Chung-Yuan Sun · San Jose, US
• Sheng Feng · Cupertino, US
• Jung-Cheun Lien · San Jose, US
• Stephen Ching Yat Chan · Sha Tin, CN

Key dates

• Filing date: Feb 7, 2002
• Grant date: Nov 22, 2005
• Expiry date: Apr 8, 2023

Classification

• Technology area (CPC H): Electricity
• CPC primary: H03K19/17796
• WIPO field: Computer technology
• WIPO sector: Electrical engineering

Abstract

A method of accessing the testing means in a Field Programmable Gate Array (“FPGA”) comprised of a plurality of functional groups (“FGs”) comprising: inputting a function netlist defining a user circuit; compiling said function netlist; and generating a logic Built-In Self Test (“BIST”) netlist; wherein said BIST netlist replaces all user registers with scan registers with a scan chain routed as the physical silicon scan chains.