Variable impedance test probe
US6970001B2 · kind B2 · utility
75Cited by
17References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 20, 2003 |
| Grant date | Nov 29, 2005 |
| Priority date | — |
| Expiry date | May 1, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06783
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A variable impedance test probe of the present invention comprises a first signal conductor, a first ground reference conductor, and a first dielectric element disposed between the first signal conductor and the first ground reference conductor. The dielectric element is configured to selectively vary an impedance of the first signal conductor relative to the ground reference conductor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.