Method and apparatus to measure jitter
US6970528B2 · kind B2 · utility
7Cited by
3References
4Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Oct 10, 2001 |
| Grant date | Nov 29, 2005 |
| Priority date | — |
| Expiry date | Feb 16, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L1/205
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A method of determining jitter is provided by providing a sample, performing an unwrap of the data and then performing a Fast Fourier Transform (FFT) of the data. The fundamental is filtered out and an inverst FFT is determined. The sparkle code is taken out and the phase is adjusted to a known phase. The noise difference at both the high and low rtates by angles is determined. The jitter by angle is calculated using the high slew variance and low slew variance. The average jitter is then calculated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.