Thermometry probe calibration method
US6971790B2 · kind B2 · utility
27Cited by
51References
2Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 10, 2003 |
| Grant date | Dec 6, 2005 |
| Priority date | — |
| Expiry date | Oct 10, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K15/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method in which thermal mass and manufacturing differences are compensated for in thermometry probes by storing characteristic data relating to individual probes into an EEPROM for each probe which is used by the temperature apparatus.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.