Patent · US Expired

Integrated circuit die for wire bonding and flip-chip mounting

US6972494B1 · kind B1 · utility

7Cited by
7References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 15, 2000
Grant dateDec 6, 2005
Priority date
Expiry dateJun 26, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/14
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An integrated circuit die carries conductive pads and thereon, the larger pads being suitable for flip-chip assembly and the smaller pads being suitable for wire bond assembly. The pitch between pads is at least the minimum required for flip-chip assembly, whereas the pitch between each of pads and the adjacent pad or pads is at least the minimum required for wire bond assembly. For wire bond assembly a passivation layer exposing all pads is provided, whereas for flip-chip assembly a passivation layer exposes only certain pads so that conductive bumps may be provided. The provision of pads complying with the minimum spacing requirements for both flip-chip and wire bond assembly enables a “dual purpose” (e.g. one set of pads being for normal production and another set for testing purposes) die to be produced without any increase in die size.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.