Patent · US Expired

Circuits associated with fusible elements for establishing and detecting of the states of those elements

US6972614B2 · kind B2 · utility

18Cited by
1References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 7, 2004
Grant dateDec 6, 2005
Priority date
Expiry dateApr 7, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C17/18
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An identification circuit for establishing and sensing the state of a fusible element used in on chip identification of the chip's type comprising: a circuit establishing control signals for turning the identification circuit on and off; dual paths energized by the control signals generated by the level setting circuit to energize one path through the fusible element to provide a state level and the other path through a reference path which provides a reference voltage level which is distinguishable from both the blown and unblown states of the fusible element; a differential sensing circuit for comparing the reference voltage level to the state level to provide a signal indicating the state of the fusible element; and protection circuitry to protect the circuit during an operation in which the state of the fusible element is set.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.