Patent · US Expired

Measuring device and method for determining a characteristic curve of a high frequency unit

US6973401B2 · kind B2 · utility

1Cited by
14References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 27, 2003
Grant dateDec 6, 2005
Priority date
Expiry dateFeb 27, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R27/32
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention relates to a method and a measuring device for determining a characteristic curve of a high frequency transmitter for transmitting a high frequency signal modulated with a modulation signal. A high frequency signal transmitted by the high frequency transmitter is received by a receiving device (16) and samples of a complex value, real baseband signal (MEAS) are generated therefrom. By demodulation of the samples of the real baseband signal (MEAS), a modulation symbol sequence (SYM) is obtained, from which an ideal baseband signal (REF) is simulated as reference signal. The real baseband signal (MEAS) is corrected, a corrected, real baseband signal (MEAS′) is generated and the deviations of the samples of the corrected, real baseband signal (MEAS′) from the samples of the ideal baseband signal (REF) are evaluated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.