Bit error rate tester
US6973600B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 1, 2002 |
| Grant date | Dec 6, 2005 |
| Priority date | — |
| Expiry date | Apr 12, 2023 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L1/243
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A device apparatus and method are detailed that allow for improved bit error rate (BER) testing, configuration, and operation of a communication device and associated physical communication link, in particular on a HDSL communication device and link. The improved communication device apparatus and method additionally allow for the communication device to utilize an embedded BER tester (BERT) to run commonly utilized BER tests on high speed communication channels (downstream and upstream) associated with the communication device. The device apparatus and method also allow for a BER test to be configured and initiated remotely, with loopback at a remote device and masking of alarm states at the remote device or local device until the BER test is complete.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.