Patent · US Expired

Method and apparatus for testing electronic components

US6973607B2 · kind B2 · utility

2Cited by

6References

11Claims

0Family size

Assignee

International Business Machines Corporation · US

Inventors

Heinz Baier · Sindelfingen, DE
Robert Francis Berry · Austin, US
Michael Criscolo · Austin, US
Pedro Martin-de-Nicolas · Austin, US
Michael T. Saunders · Round Rock, US
Kanti C. Shah · Austin, US

Key dates

Filing date	Nov 29, 2001
Grant date	Dec 6, 2005
Priority date	—
Expiry date	Nov 20, 2022

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/2236
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

An apparatus and a method for testing one or more processors. The apparatus and method provide a host computer that issues test case information. The test case information is translated from the architecture used by a host computer to the architecture required by the electronic components. The processors are then able to perform the test case.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.