Patent · US Expired

Full width array scanning spectrophotometer

US6975949B2 · kind B2 · utility

78Cited by
19References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 27, 2004
Grant dateDec 13, 2005
Priority date
Expiry dateJun 3, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/0627
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A full width array spectrophotometer for full width scanning color analysis of color test targets, with one or two substantially linear elongated arrays of closely spaced multiple LED illumination sources of plural different color emissions in a multiply repeated pattern of at least three or four different colors transversely spanning a printer paper path and sequentially illuminated to illuminate a transverse band across a printed sheet moving in the paper path, and a corresponding elongated low cost light imaging bar with a parallel and correspondingly elongated array of multiple closely spaced different color sensitive (three or four rows of color-filtered) photodetectors, which imaging bar is positioned to detect and analyze light reflected from the transverse sequentially illuminated band.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.