Patent · US Expired

Method and apparatus for predicting runway overrun

US6978205B2 · kind B2 · utility

13Cited by
9References
2Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 26, 2004
Grant dateDec 20, 2005
Priority date
Expiry dateOct 26, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG08G5/54
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

A critical point on a runway indicates a point at which an aircraft may experience a runway overrun if landing beyond the critical point. A path projection is extended from the aircraft at a descent slope angle to determine whether the aircraft will land beyond the critical point at the current descent slope. Timely alerts may be provided by accounting for the time required to announce a distance value, and the distance traveled during the announcement.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.