Patent · US Expired

Rating apparatus and method for evaluating bugs

US6978441B2 · kind B2 · utility

8Cited by

3References

27Claims

0Family size

Assignee

Sun Microsystems Inc. · US

Inventors

Christopher Atwood · Santa Clara, US
Yousef Yacoub · San Jose, US
Eric R. Reid · Richland, US
James Liu · Sunnyvale, US
Angelo Rajadurai · Dodgeville, US
Prashant Srinivasan · Savanuru, IN
Mehdi Ghazizadeh · San Francisco, US

Key dates

Filing date	Oct 3, 2001
Grant date	Dec 20, 2005
Priority date	—
Expiry date	Jul 10, 2023

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/366
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method of rating a bug, including reporting the bug to a business entity by an interested party, entering information regarding the bug into a database, assigning a priority number for the bug, calculating a sigma number for the bug using the priority number, evaluating the bug to be fixed using the sigma number, and escalating the bug. A bug council rating apparatus, including a database to store the information entered using a graphical user interface, a priority number module configured to generate a priority number, and a sigma number module configured to generate a sigma number.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.