Patent · US Expired

Dual function indenter

US6978664B1 · kind B1 · utility

5Cited by
7References
3Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 17, 2003
Grant dateDec 27, 2005
Priority date
Expiry dateJun 3, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2203/0286
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A dual function indenter for use in a nanoindentation system is disclosed. The indenter of the present invention includes an indentation tip having a machined flat at its distal end forming a compression platen. A sharp imaging probe tip adjacent the machined flat extends parallel to the centerline axis of the indentation tip. The sharp imaging probe tip extends beyond the surface of the machined flat for in situ scanning/imaging of the sample surface.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.