Patent · US Expired

Interlayer connections for layered electronic devices

US6979643B2 · kind B2 · utility

2Cited by
10References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 25, 2003
Grant dateDec 27, 2005
Priority date
Expiry dateNov 25, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/76816
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

In a method for forming interlayer connections, metal conducting paths in an overlaying layer and vias forming the deposit in one and the same operation. In an interlayer connection formed in this manner the vias are provided integral with connecting conducting paths in the overlaying layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.