X-ray arrangement and operating method for compensating scattered radiation

US6980626B2 · kind B2 · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Burkhard Groh · Chicago, US
• Volker Heer · Gundelsheim, DE
• Mathias Hörnig · Erlangen, DE
• Bernhard Sandkamp · Erlangen, DE

Key dates

• Filing date: Jul 17, 2003
• Grant date: Dec 27, 2005
• Expiry date: Dec 14, 2023

Classification

• Technology area (CPC A): Human Necessities
• CPC primary: A61B6/5282
• WIPO field: Medical technology
• WIPO sector: Instruments

Abstract

Method for an x-ray arrangement for compensation of scattered radiation and x-ray apparatusThe invention concerns a method for an x-ray arrangement comprising two x-ray systems (1, 2) for compensation of scattered radiation. In addition, the invention concerns an x-ray apparatus with two x-ray systems (1, 2) which respectively comprise an x-ray source (4, 5) and an x-ray detector (5, 7). An x-ray scattered radiation image based on the x-ray radiation (11) scattered on a subject (P) is acquired for at least one of the two x-ray systems (1, 2), given a definite positioning of the x-ray systems (1, 2) relative to one another. The acquired x-ray scattered radiation image is saved and used for subtraction from an x-ray image acquired with the x-ray system (1, 2) in order to compensate for the influence of the scattered radiation originating from the other x-ray system (1, 2) and to achieve an improved image quality.