Patent · US Expired

Method of automatically calibrating electronic controls in a mass spectrometer

US6982413B2 · kind B2 · utility

11Cited by
12References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 3, 2004
Grant dateJan 3, 2006
Priority date
Expiry dateSep 3, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J49/022
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

The present invention provides methods and electronic circuits for a chemical analyzer, for example, a mass spectrometer, which provide generated signals that are maintained to a required level of precision. A user may specify the required precision for the signals which operate the spectrometer and may specify the required precision for the mass analysis, either explicitly or by choosing a predefined configuration. The spectrometer will then generate the signals to the required precision despite changes in operating conditions, environmental conditions, component aging and degradation, or other nonfailure effects that otherwise affect analyzer calibration and signal output. The electronic circuits incorporate signal monitoring to maintain closed-loop signal control. The closed-loop control includes a feedback path which may include discrete components and may include software enabling a processor to adjust the generated signals to maintain the required precision of the signals and analysis. Further, the spectrometer may monitor signals and analyze and store data in order to predict future performance, including precision, analysis limitations, impending component degradation or fa…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.