Sample analysis systems
US6982431B2 · kind B2 · utility
220Cited by
341References
27Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 13, 2002 |
| Grant date | Jan 3, 2006 |
| Priority date | — |
| Expiry date | Sep 7, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N35/028
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems, and components thereof, for analyzing samples. These systems include apparatus and methods for generating, transmitting, detecting, and/or analyzing light, including without limitation high-throughput optical screening devices for analyzing samples at one or more assay sites. These systems also include apparatus and methods for supporting samples for analysis, including without limitation multiwell sample holders such as microplates.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.