Patent · US Expired

Apparatus and method using wavefront phase measurements to determine geometrical relationships

US6982678B2 · kind B2 · utility

5Cited by
8References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 2, 2004
Grant dateJan 3, 2006
Priority date
Expiry dateJul 7, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01Q3/26
  • WIPO fieldTelecommunications
  • WIPO sectorElectrical engineering

Abstract

An apparatus includes a microwave source that produces a microwave feed beam, and a first pair of microwave sensors that each intercept and receive a portion of the microwave feed beam. The two microwave sensors are spaced apart from each other along a first-pair axis. A first phase-comparison device has as it inputs the output signals of the two microwave sensors, and as an output a first phase comparison of the first-sensor output signal and the second-sensor output signal. A first geometrical calculator has as an input the first phase comparison and as an output a geometrical relationship of the first-pair axis to an other feature. This geometrical relationship output may be used to generate a control signal that is used to alter the geometrical relationship. There may be additional microwave sensors operating in a similar manner but spaced to provide information for other geometrical axes or allow improvements in geometrical measurements.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.