Multi-point calibration method for imaging light and color measurement device
US6982744B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 15, 2002 |
| Grant date | Jan 3, 2006 |
| Priority date | — |
| Expiry date | Aug 24, 2023 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N17/04
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A multi-point calibration method is provided for an imaging light and color measurement device. A light emitting surface with a plurality of light emitting areas is provided. The luminance or color of each light emitting area of the light emitting surface at a specific angle is measured using a spot measurement instrument. By aligning the spot measurement instrument with one of the light emitting areas at a time, the luminance or color of the light emitting areas of the light emitting surface is measured. A measurement of the light emitting surface is made with the imaging light and color measurement device. A matrix of correction factors is calculated to correct the areas as measured by the imaging light and color measurement device to be equivalent to those measured by the spot photometer. While a display device is measured by the imaging light and color measurement device, the measured luminance or color values thereof are corrected by the screen gain correction matrix.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.