Patent · US Expired

Part transfer apparatus, control method for part transfer apparatus, IC test method, IC handler, and IC test apparatus

US6984973B2 · kind B2 · utility

1Cited by
4References
29Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 5, 2002
Grant dateJan 10, 2006
Priority date
Expiry dateFeb 23, 2023

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/49004
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A configuration having two drive shafts, a drive system 4 connected to one end of each drive shaft for rotationally driving the respective drive shaft, and a holding and transfer mechanism 5, 6 connected to the other end and having a holding device 5a, 6a for holding an IC, each holding and transfer mechanism 5, 6 being able to operate independently.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.