Patent · US Expired

Testing method of array configuration for multiple disk-array system

US6985971B2 · kind B2 · utility

7Cited by
5References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 25, 2003
Grant dateJan 10, 2006
Priority date
Expiry dateFeb 2, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04L1/22
  • WIPO fieldDigital communication
  • WIPO sectorElectrical engineering

Abstract

An array configuration testing method is proposed for multiple disk-array system containing at least one disk array. The method comprises steps of: reading array configuration; acquiring a quantity of disk drives in the array; reading the serial check sum of all disk drives in the array; and comparing the quantity of disk drives in the array and another quantity of disk drives deduced from the serial check sum of all disk drives in the array. The method further comprises steps of: acquiring the disk sequence/function of the array in the array configuration; comparing the disk sequence/function with another disk sequence/function deduced from the serial check sum of each disk drive in one array. The method cross-examines the serial check sum of each disk drive in the same array and the quantity of disk drives in the array as well as disk sequence/function record in order to check data integrity in the array configuration.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.