Patent · US Expired

Controlling ion populations in a mass analyzer

US6987261B2 · kind B2 · utility

42Cited by
4References
79Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 23, 2004
Grant dateJan 17, 2006
Priority date
Expiry dateJan 24, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J49/4265
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

Method and apparatus of controlling an ion population to be analyzed in a mass analyzer. Ions are accumulated for an injection time interval determined as a function of an ion accumulation rate and a predetermined desired population of ions. The accumulation rate represents a flow rate of ions from a source of ions into an ion accumulator. Ions derived from the accumulated ions are introduced into the mass analyzer for analysis.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.