Built-in-self-test apparatus and method for analog-to-digital converter
US6987472B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 6, 2004 |
| Grant date | Jan 17, 2006 |
| Priority date | — |
| Expiry date | Aug 6, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/12
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A built-in-self-test apparatus for an analog-to-digital converter includes a digital-to-analog converter, a low-pass filter, a histogram analyzer and a software engine. The digital-to-analog converter is intended to generate a first signal. The low-pass filter is intended to smoothen the first signal so that an analog-to-digital converter can perform sampling on the smoothened first signal by a second signal, wherein the bit number of the second signal is greater than or equal to that of the first signal, and the frequency of the second signal is a multiple of that of the first signal. The histogram analyzer is electrically connected to the output end of the analog-to-digital converter. The software engine is electrically connected to the output end of the histogram analyzer so as to display the characteristics of the analog-to-digital converter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.