Methods and apparatus for identification and imaging of specific materials
US6987833B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 16, 2003 |
| Grant date | Jan 17, 2006 |
| Priority date | — |
| Expiry date | Jan 4, 2024 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B6/482
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method for analyzing materials in an object includes acquiring x-ray projection data of the object at high energy and at low energy for a plurality of views. The acquired x-ray projection data is utilized in a material decomposition to determine material densities at each pixel for two selected basis materials. A composition of an object at each pixel is determined utilizing a determined mapping of material density regions for the two selected basis materials. An image indicative of the composition of the object is displayed utilizing the determined composition.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.