Patent · US Expired

Methods and apparatus for identification and imaging of specific materials

US6987833B2 · kind B2 · utility

34Cited by
15References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 16, 2003
Grant dateJan 17, 2006
Priority date
Expiry dateJan 4, 2024

Classification

  • Technology area (CPC A)Human Necessities
  • CPC primaryA61B6/482
  • WIPO fieldMedical technology
  • WIPO sectorInstruments

Abstract

A method for analyzing materials in an object includes acquiring x-ray projection data of the object at high energy and at low energy for a plurality of views. The acquired x-ray projection data is utilized in a material decomposition to determine material densities at each pixel for two selected basis materials. A composition of an object at each pixel is determined utilizing a determined mapping of material density regions for the two selected basis materials. An image indicative of the composition of the object is displayed utilizing the determined composition.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.