Testing arrangement for optical devices

US6989902B2 · kind B2 · utility

Assignee

• AGILENT TECHNOLOGIES, INC. · US

Inventors

• Siegfried Mailaender · Pfrondorf, DE
• Malte Schlueter · Eppelheim, DE

Key dates

• Filing date: Feb 8, 2002
• Grant date: Jan 24, 2006
• Expiry date: May 21, 2022

Classification

• Technology area (CPC G): Physics
• CPC primary: G01M11/331
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A measuring setup for measuring an optical device under test—DUT—includes an optical signal source for applying an optical signal to the DUT, and an optical receiver unit for measuring a response of the DUT on the applied signal. A measurement unit is coupled between the optical signal source and the optical receiver unit. The measurement unit comprises an optical circuit to provide optical signals from and/or to the DUT for measuring the DUT, whereby the optical circuit comprises optical components showing high susceptibility to mechanical noise. A shielding unit receives the optical circuit and provides at least partial shielding of the optical circuit and/or the DUT against mechanical noise.