Photogrammetric measurement system and method
US6990215B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 31, 2001 |
| Grant date | Jan 24, 2006 |
| Priority date | — |
| Expiry date | Jun 7, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01C11/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for characterizing a geometric element of an object includes positioning a calibrated target adjacent a calibration geometric element, the calibrated target having at least two differentially detectable features having a known geometric relationship to each other. Next a relationship of the calibrated target to the calibration geometric element is determined, and the calibrated target is moved adjacent a geometric feature of an object desired to be characterized. Then photogrammetry is applied to the calibrated target features and the desired geometric feature to spatially characterize the desired geometric feature. A system for characterizing a geometric element of an object includes the movable calibrated target and a photogrammetric analysis system for determining a relationship of the calibrated target to a calibration geometric element and for spatially characterizing the desired geometric feature using the calibrated target features.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.