Systems and methods for discovering fully dependent patterns
US6990486B2 · kind B2 · utility
10Cited by
7References
32Claims
0Family size
Assignee
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Key dates
| Filing date | Aug 15, 2001 |
| Grant date | Jan 24, 2006 |
| Priority date | — |
| Expiry date | Apr 9, 2023 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S707/99945
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A new form of pattern referred to as a fully dependent pattern or d-pattern is provided. The d-pattern captures dependence among a set of items based on a dependency test. An efficient algorithm is provided for discovering all d-patterns in data. Specifically, a linear algorithm is provided for testing whether a pattern is an d-pattern. Further, a pruning algorithm is provided that prunes the search space effectively. Still further, a level-wise algorithm for mining d-patterns is provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.