Testing resistance bolometer arrays
US6992291B2 · kind B2 · utility
6Cited by
3References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 14, 2002 |
| Grant date | Jan 31, 2006 |
| Priority date | — |
| Expiry date | Oct 6, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J5/53
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of testing resistance bolometer arrays involves applying different voltages to different bolometers so as to produce a detectable difference between adjacent bolometers under normal conditions. The voltages may be applied in a recognizable pattern so that faults can be readily identified from a visual display of the array.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.