Birefringence measurement of large-format samples
US6992758B2 · kind B2 · utility
1Cited by
18References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 5, 2003 |
| Grant date | Jan 31, 2006 |
| Priority date | — |
| Expiry date | Mar 28, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/103
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The disclosure is directed to systems and methods for precisely measuring birefringence properties of large-format samples of optical elements. A gantry-like configuration is employed for precise movement of birefringence measurement system components relative to the sample. There is also provided an effective large-format sample holder that adequately supports the sample to prevent induced birefringence therein while still presenting a large area of the sample to the unhindered passage of light.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.