Method and system for automated outlying feature and outlying feature background detection during processing of data scanned from a molecular array
US6993172B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 29, 2001 |
| Grant date | Jan 31, 2006 |
| Priority date | — |
| Expiry date | May 26, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/253
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system for employing pixel-based, signal-intensity data contained within areas of a scanned image of a molecular array corresponding to features and feature backgrounds in order to determine whether or not the features or feature backgrounds have non-uniform signal intensities and are thus outlier features and outlier feature backgrounds. A calculated, estimated variance for the signal intensities within a feature or feature background is compared to a maximum allowable variance calculated for the feature or feature background based on a signal intensity variance model. When the experimental variance is less than or equal to the maximum allowable variance, the feature or feature background is considered to have acceptable signal-intensity uniformity. Otherwise, the feature or feature background is flagged as an outlier feature or outlier feature background.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.