Patent · US Expired

Gap histogram on-line randomness test

US6993543B2 · kind B2 · utility

8Cited by
4References
19Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 22, 2002
Grant dateJan 31, 2006
Priority date
Expiry dateFeb 15, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F17/18
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method and apparatus for testing random numbers generated by a random-number generator in real time. A stream of random bits generated by the random-number generator is segmented into a predefined block of bits, then these blocks undergo a gap-length-calculation operation in which it is determined for which specific range the gap belongs to, then these gap length values are applied to an exponential-counting operation to obtain and update gap-frequency values for different bit patterns and gap ranges. Thereafter, the updated gap-frequency values are compared to at least one predetermined acceptance range, so that if at least one of the gap-frequency values falls repeatedly outside the predetermined acceptance range more than a predetermined number of times, it is determined that the generated random bits are insufficiently random.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.