Patent · US Expired

Silicon-on-insulator latch-up pulse-radiation detector

US6995376B2 · kind B2 · utility

10Cited by
8References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 1, 2003
Grant dateFeb 7, 2006
Priority date
Expiry dateJul 7, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10F30/263

Abstract

A radiation detector formed using silicon-on-insulator technology. The radiation detector includes a silicon layer formed on an insulating substrate, wherein the silicon layer includes a PNPN structure, and a gate layer formed over the PNPN structure, wherein the gate layer includes a PN gate. Latch-up occurs in the radiation detector only in response to incident radiation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.