Device for electromagnetic characterisation of a tested structure
US6995569B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 28, 2001 |
| Grant date | Feb 7, 2006 |
| Priority date | — |
| Expiry date | Jan 21, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/69
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device for electromagnetic characterization of a tested structure elevates, on a predetermined frequency band, distribution parameters of the structure and parameters characteristic of the spurious rays of the structure. The device includes an electric signal generator and an analyzer for analyzing the signal transmitted by the generator and signals reflected by the structure and signals transmitted by the structure. In addition, the electric signal generator is a pulsed signal generator whereof the spectrum is at least as broad as the predetermined frequency band, and the analyzer includes a filter for temporal filtering of the signals it receives, to eliminate spurious signals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.