Patent · US Expired

Integrated circuit analysis method and program product

US6996792B2 · kind B2 · utility

6Cited by
6References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 29, 2002
Grant dateFeb 7, 2006
Priority date
Expiry dateSep 25, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/3312
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for analyzing integrated circuits (IC's) has steps of dividing the circuit into a plurality of individual blocks that are linked together. Each block is comprised of a plurality of latches and paths connecting the latches. The blocks are compressed by removing all detail not required for performing global transparency timing modeling.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.