Calibration of the transformation of spectral X-ray attenuation values in density and atomic number information
US6997610B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 6, 2004 |
| Grant date | Feb 14, 2006 |
| Priority date | — |
| Expiry date | May 16, 2024 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S378/901
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method is for calibration of a transformation of at least two X-ray attenuation values (which are determined using different X-ray spectra) for a material, to a value for the density and a value for the atomic number of the material. A first distribution is recorded of first X-ray attenuation values obtained from a calibration phantom using a first X-ray spectrum, and a second distribution is recorded of second X-ray attenuation values obtained from the calibration phantom using a second X-ray spectrum. The recorded X-ray attenuation values are used to produce a density function and to produce an atomic number function. A value for the density and for the atomic number of the calibration sample is determined with the aid of the density function and the atomic number function, and a discrepancy between the determined values and the actual density and atomic number of the calibration sample is found. The discrepancy is used for producing a mapping rule which changes the values determined by the density function and the atomic number function to the actual values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.