Patent · US Expired

Classification of deviations in a process

US6999898B2 · kind B2 · utility

27Cited by
15References
32Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 31, 2003
Grant dateFeb 14, 2006
Priority date
Expiry dateMar 14, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N33/18
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A process analysis system includes sensors and a processing system. The sensors monitor the process to generate sensor signals. The processing system processes the sensor signals to detect a deviation from a baseline for the process. The processing system generates a process vector for the deviation in response to detecting the deviation. The processing system compares the process vector to a plurality of library vectors to classify the deviation. In some examples, the process comprises a system that supplies water.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.