Extended input/output measurement facilities
US7000036B2 · kind B2 · utility
71Cited by
37References
23Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 12, 2003 |
| Grant date | Feb 14, 2006 |
| Priority date | — |
| Expiry date | Feb 16, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/88
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Input/output (I/O) measurement facilities are provided. An extended I/O measurement block facility is provided that enables measurement blocks to be stored in discontiguous areas of main storage and to be accessed directly via addresses. In a further aspect, an extended I/O measurement word facility is provided that facilitates the obtaining of measurement data for single I/O operations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.