Devices for storing and accumulating defect information, semiconductor device and device for testing the same
US7000156B2 · kind B2 · utility
2Cited by
10References
10Claims
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Assignee
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Key dates
| Filing date | Oct 2, 2002 |
| Grant date | Feb 14, 2006 |
| Priority date | — |
| Expiry date | Jan 26, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5606
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A defect information storing device includes two tables for storing information on defective points of a semiconductor device. The first table stores column addresses and number of defective points existing at this column address for (r×c+c) lines. The second table stores row addresses, number of defective points existing at this row address, and column identifiers indicating the storage place of the column address of the defective point in the first table for (r×c+r) lines.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.