Patent · US Expired

Method and apparatus for measuring jitter

US7002358B2 · kind B2 · utility

28Cited by
8References
19Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 10, 2003
Grant dateFeb 21, 2006
Priority date
Expiry dateDec 10, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31725
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of measuring jitter includes generating a jitter pulse having a width corresponding to an amount of jitter. The jitter pulse is provided to a plurality (M) of latches serially coupled to successively trim the pulse as it propagates through the serially coupled latches. Each latch, li, provides an output bi indicative of receipt of an edge of the jitter pulse.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.