Patent · US Expired

Apparatus and method for measuring EMI level of electronic device

US7002359B2 · kind B2 · utility

1Cited by
0References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 21, 2004
Grant dateFeb 21, 2006
Priority date
Expiry dateApr 21, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05K9/0069
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus and a method for measuring an electric magnetic interference (EMI) level of a radio frequency device is disclosed. The apparatus for measuring a level of electric magnetic interference (EMI) with an electronic device to radiate an electromagnetic wave, the apparatus including: a test device for outputting a signal in response to the electromagnetic wave radiated from the electric device; a calculating unit for calculating a group_delay variation information of the test device by using the signal from the test device; a processor for storing a reference group_delay variation; and an analyzer for analyzing the level of EMI by comparing the reference group_delay variation information and the group_delay variation information.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.