Waveguide-based optical interferometer
US7003186B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 6, 2003 |
| Grant date | Feb 21, 2006 |
| Priority date | — |
| Expiry date | Jul 8, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2290/60
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Techniques for measuring spatial locations. An apparatus for measuring spatial locations includes a first object at a first location, a second object at a second location, and a waveguide-based interferometer coupled between the first object and the second object. The waveguide-based interferometer includes a waveguide material. The waveguide material is adapted to carry at least a reference beam and a measurement beam. The reference beam traverses a first path defined within the waveguide material. The measurement beam traverses a second path defined within the waveguide material and a third path defined outside of the waveguide material. The third path is related to at least one of the first location and the second location.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.