Component temperature measuring method
US7003425B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 1, 2004 |
| Grant date | Feb 21, 2006 |
| Priority date | — |
| Expiry date | Jun 1, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J5/0022
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of measuring temperature of a component capable of emitting thermal radiation and reflecting background radiation having the steps of: providing a pyrometer for measuring the radiation from the component, characterised by coating a part of the component with a first emissivity coating and a part of the component with a different and second emissivity coating, each with known emissivities EH and EL respectively, recording a first radiation measurement from the first emissivity coating RH and a second radiation measurement from the second emissivity coating RL, then calculating the true radiation RBlade from the component from the equation and relate the RBlade value to the true component temperature by calibration of the pyrometer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.