Patent · US Expired

Zero threshold voltage pFET and method of making same

US7005334B2 · kind B2 · utility

0Cited by
10References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 14, 2004
Grant dateFeb 28, 2006
Priority date
Expiry dateMay 14, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/038

Abstract

A zero threshold voltage (ZVt) pFET (104) and a method of making the same. The ZVt pFET is made by implanting a p-type substrate (112) with a retrograde n-well (116) so that a pocket (136) of the p-type substrate material remains adjacent the surface of the substrate. This is accomplished using an n-well mask (168) having a pocket-masking region (184) in the aperture (180) corresponding to the ZVt pFET. The n-well may be formed by first creating a ring-shaped precursor n-well (116′) and then annealing the substrate so as to cause the regions of the lower portion (140′) of the precursor n-well to merge with one another to isolate the pocket of p-type substrate material. After the n-well and isolated pocket of p-type substrate material have been formed, remaining structures of the ZVt pFET may be formed, such as a gate insulator (128), gate (132), source (120), and drain (124).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.