System and method for application control in measurement devices
US7005846B2 · kind B2 · utility
0Cited by
17References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 17, 2002 |
| Grant date | Feb 28, 2006 |
| Priority date | — |
| Expiry date | Nov 23, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R13/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for application control in measurement devices is disclosed. The method includes installing a new application using the device's graphical user interface, extending the device's menu system for the new application, launching the new application using the device's extended menu system, and controlling the device using the new application through a remote control mechanism of the device. A system of application control in a measurement device is also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.