Real time contour line generation
US7006106B2 · kind B2 · utility
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10References
18Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 9, 2004 |
| Grant date | Feb 28, 2006 |
| Priority date | — |
| Expiry date | Mar 9, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T11/203
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The generation of contour plot images from elevation data in real time for use in a digital moving map. The contour line interval is dynamically selectable. The elevation data is scanned in 2 dimensions simultaneously, but in a single pass. As the elevation data is scanned for the given contour line interval, a history is maintained of the contour line elevation state in both dimensions. At any point, only comparisons against the two historical values are required to determine if a point on a contour line exists.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.