Patent · US Expired

Three-dimensional measurement device and three-dimensional measurement method

US7009690B2 · kind B2 · utility

20Cited by
8References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 16, 2001
Grant dateMar 7, 2006
Priority date
Expiry dateMar 22, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T7/521
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The purpose of the present invention is to realize a compact three-dimensional measurement device of high resolution. In the present invention, a pulse light is projected on an object, the light reflected from the object is received by a solid state area sensor having a plurality of photoelectric conversion elements, the area sensor is controlled with a timing synchronized with the projection of the pulse light, and the distance to each photoelectric conversion element is measured based on the output of the solid state area sensor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.