Method for conducting a test measurement in a CT apparatus, and CT apparatus

US7010082B2 · kind B2 · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Peter Hein · Bamberg, DE
• Helmut Kropfeld · Forchheim, DE
• Mario Reinwand · Breitbrunn, DE

Key dates

• Filing date: May 28, 2004
• Grant date: Mar 7, 2006
• Expiry date: May 28, 2024

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2223/419
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

In an x-ray computed tomography apparatus and a method for conducting test measurements therein, a combined phantom is employed that is formed of several individual phantoms, each forming a segment of the combined phantom, and the combined phantom is affixed to a platform of the computed tomography apparatus that is movable with respect to an x-ray data acquisition unit of the computed tomography apparatus. The platform is moved into a first position and a first x-ray absorption distribution of a first segment of the combined phantom is obtained, and the platform is moved into a second position and a second x-ray absorption distribution is obtained of a second segment of the phantom. Movement of the platform and operation of the data acquisition unit for obtaining the first and second x-ray distributions are automatically controlled by a computer program.